Journal
PHYSICAL REVIEW B
Volume 81, Issue 14, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.81.140101
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Funding
- European 6th Framework STREP [FP-6-NMP-CT-2006-032616]
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We report a temperature-dependent high-resolution x-ray diffraction investigation of 200-nm epitaxial BiFeO3 thin films grown on (001) SrTiO3. We find that BiFeO3 undergoes two high-temperature transitions: a first-order alpha-beta phase transition between 745 and 780 degrees C and a more diffuse transition toward the gamma phase at 860 degrees C. Reciprocal space maps reveal that thin films remain monoclinic crossing the alpha-beta phase transition. Linear extrapolation of the in-plane lattice parameters to higher temperatures appears to rule out cubic symmetry for the gamma phase.
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