4.6 Article

Polarization dependence and symmetry analysis in indirect K-edge RIXS

Journal

PHYSICAL REVIEW B
Volume 82, Issue 3, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.82.035113

Keywords

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Funding

  1. DOE [DE-AC02-76SF00515]
  2. NSF [DMR-0705086]
  3. Direct For Mathematical & Physical Scien
  4. Division Of Materials Research [1036261] Funding Source: National Science Foundation

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We present a study of the charge-transfer excitations in undoped Nd2CuO4 using resonant inelastic x-ray scattering (RIXS) at the Cu K-edge. At the Brillouin zone center, azimuthal scans that rotate the incident-photon polarization within the CuO2 planes reveal weak fourfold oscillations. A comparison of spectra taken in different Brillouin zones reveals a spectral weight decrease at high-energy loss from forward-to back-scattering. We show that these are scattered-photon polarization effects related to the properties of the observed electronic excitations. Each of the two effects constitutes about 10% of the inelastic signal while the 4p-as-spectator approximation describes the remaining 80%. Raman selection rules can accurately model our data, and we conclude that the observed polarization-dependent RIXS features correspond to E-g and B-1g charge-transfer excitations to non-bonding oxygen 2p bands, above 2.5 eV energy-loss, and to an E-g d -> d excitation at 1.65 eV.

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