Journal
PHYSICAL REVIEW B
Volume 79, Issue 11, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.79.115127
Keywords
crystal structure; hopping conduction; interface roughness; lanthanum compounds; metal-insulator transition; molecular beam epitaxial growth; reflection high energy electron diffraction; strontium compounds; superlattices; X-ray scattering
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(LaNiO3)(n)/(SrMnO3)(2) superlattices were grown using ozone-assisted molecular beam epitaxy. In situ reflection high-energy electron diffraction and x-ray scattering has been used to characterize the structural properties of the superlattices, which are strained to the SrTiO3 substrates. The superlattices exhibit excellent crystallinity and interfacial roughness of less than 1 unit cell. A metal-insulator transition is observed as n is decreased from 4 to 1. Analysis of the transport data suggests an evolution from gapped insulator (n=1) to hopping conductor (n=2) to metal (n=4) with increasing LaNiO3 concentration.
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