Journal
PHYSICAL REVIEW B
Volume 79, Issue 20, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.79.205423
Keywords
lead; metallic thin films; monolayers; phonon dispersion relations; Rayleigh scattering; surface phonons; surface structure; time of flight spectra
Funding
- Alexander von Humboldt Foundation
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Thin films of lead have been grown on the Cu(111) surface and their structure and phonon dispersion curves have been investigated with high-resolution helium atom scattering. The diffraction pattern of the first monolayer (ML) indicates a p(4x4) structure. Films consisting of N=3, 4, 5, and bulklike 50 ML all have a regular (1x1) structure with the same lattice constant as the bulk and small superimposed p(4x4) peaks for the thinnest films. The time-of-flight spectra reveal an unusually large number of inelastic peaks for all the films. The results have been analyzed in terms of dispersion curves which exhibit more than 1/2 the total number of expected two N modes active in the planar scattering geometry. Dispersion curves for an unannealed 5 ML film are also reported. A force-constant model fitted to the bulk dispersion curves can only qualitatively reproduce some of the data but help to explain some features. Along the Gamma over bar-K over bar direction, a Kohn anomaly is identified for the 3, 4, and 5 ML films at nearly the same wave vector as in the bulk along the equivalent direction.
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