Journal
PHYSICAL REVIEW B
Volume 79, Issue 9, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.79.094525
Keywords
bismuth compounds; copper compounds; dielectric losses; ellipsometry; lanthanum compounds; strontium compounds; X-ray scattering
Funding
- NSERC of Canada
- Canadian Foundation for Innovation
- Ontario Ministry of Research and Innovation
- U. S. DOE, Office of Science [DE-AC02-98CH10886]
- U. S. DOE, Office of Science, Office of Basic Energy Sciences [W-31-109-ENG38]
Ask authors/readers for more resources
We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin-zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi2CuO4, CuGeO3, Sr2Cu3O4Cl2, La2CuO4, and Sr2CuO2Cl2, and analyzed by considering both incident and scattered-photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi2CuO4 and CuGeO3.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available
Share Paper
