Journal
PHYSICAL REVIEW B
Volume 79, Issue 4, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.79.045416
Keywords
Auger electron spectra; elemental semiconductors; eutectic alloys; gold alloys; liquid alloys; liquid films; melting point; metallic thin films; silicon; silicon alloys; solidification; surface structure; X-ray microscopy
Funding
- Royal Society
- EPSRC-GB
- EPSRC [EP/D052939/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/D052939/1] Funding Source: researchfish
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We investigated the formation of an AuSi eutectic from a silicon (100) surface cleaned under ultrahigh vacuum conditions and an evaporated 3-nm-thick gold layer using a suite of surface-sensitive x-ray techniques and Auger spectroscopy. The signature of the presence of the eutectic liquid came from its recently discovered surface-ordered state, whose diffraction pattern is confirmed. As expected, the eutectic started to form at its melting temperature (380 degrees C), but a small change in the film thickness was detected beforehand. The surface-ordered state was found to disappear at T=473 degrees C without the appearance of a second phase, but also to persist after resolidification of the liquid. Subsequent electron and x-ray microscopy after the sample was removed from vacuum showed the presence of phase-separated gold in the form of micronsized crystals on the surface.
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