4.6 Article

Fast molecular-dynamics simulation for ferroelectric thin-film capacitors using a first-principles effective Hamiltonian

Journal

PHYSICAL REVIEW B
Volume 78, Issue 10, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.78.104104

Keywords

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Funding

  1. JNCASR
  2. Rutgers University
  3. Ministry of Education, Culture, Sports, Science and Technology (MEXT) of Japan
  4. Japan Society for the Promotion of Science (JSPS)
  5. ONR [N00014-05-1-0054]

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A newly developed fast molecular dynamics method is applied to BaTiO3 ferroelectric thin-film capacitors with short-circuited electrodes or under applied voltage. The molecular dynamics simulations based on a first-principles effective Hamiltonian clarify that dead layers (or passive layers) between ferroelectrics and electrodes markedly affect the properties of capacitors, and predict that the system is unable to hop between a uniformly polarized ferroelectric structure and a striped ferroelectric domain structure at low temperatures. Simulations of hysteresis loops of thin-film capacitors are also performed, and their dependence on film thickness, epitaxial constraints, and electrodes are discussed.

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