Journal
PHYSICAL REVIEW B
Volume 77, Issue 11, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.77.115317
Keywords
-
Funding
- Austrian Science Fund (FWF) [F 2507, F 2505] Funding Source: researchfish
Ask authors/readers for more resources
For studying surface properties of nanocrystals, we present an approach based on a combination of the grazing incidence small angle x-ray scattering (GISAXS) technique and tomographic methods. In this approach, GISAXS data from a micro- or nanometer sized object are collected successively at different azimuthal angular positions, which makes it possible to measure the whole three-dimensional (3D) intensity distribution in reciprocal space. As an example, the full 3D reciprocal space intensity originating from the truncated epitaxially grown (111) facetted SiGe pyramids with a square base on (001) Si substrate was measured. This technique enables us to observe and explain crystal truncation planes which originate from scattering on the edges of the nanocrystals.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available