☆ 4.6 Article

Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior

PHYSICAL REVIEW B (2008)

Related references

Note: Only part of the references are listed.
Article Microscopy

Measurement of mean free paths for inelastic electron scattering of Si and SiO2

CW Lee et al.

JOURNAL OF ELECTRON MICROSCOPY (2002)

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