Hyperfine structure and isotope shift in the 3s2 3 p2 3P0,1,2 → 3s2 3 p4 p 3P0,1,2 transitions in silicon by Doppler-free in-source two-photon resonance-ionization spectroscopy

A high-resolution technique for direct in-source laser spectroscopy within a hot cavity laser ion source has been demonstrated by applying Doppler free two-photon resonance ionization spectroscopy. An injection-locked narrow- bandwidth pulsed titanium: sapphire laser operating in high repetition rate was used for resonance ionization of silicon. The isotope shift of Si-28, Si-29, and Si-30 as well as the hyperfine structure of all two-photon transitions of the 3s(2) 3 p(2) P-3(0,1,2) -> 3s(2) 3 p4 p P-3(0,1,2) multiplet for Si-29 were recorded at an overall experimental spectral linewidth of 90 MHz.