4.6 Article

Single-shot carrier-envelope-phase-tagged ion-momentum imaging of nonsequential double ionization of argon in intense 4-fs laser fields

Journal

PHYSICAL REVIEW A
Volume 83, Issue 1, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevA.83.013412

Keywords

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Funding

  1. Chemical Sciences, Geosciences, and Biosciences Division, Office of Basic Energy Sciences, Office of Science, US Department of Energy
  2. National Science Foundation [CHE-0822646]
  3. DFG [PA 730/4]
  4. Emmy-Noether program
  5. International Collaboration in Chemistry program
  6. Cluster of Excellence: Munich Center for Advanced Photonics (MAP)
  7. LaserLab Europe
  8. Fulbright Commission
  9. Direct For Mathematical & Physical Scien
  10. Division Of Chemistry [0822646] Funding Source: National Science Foundation

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Single-shot carrier-envelope-phase (CEP) tagging is combined with a reaction mircoscope (REMI) to investigate CEP-dependent processes in atoms. Excellent experimental stability and data acquisition longevity are achieved. Using this approach, we study the CEP effects for nonsequential double ionization of argon in 4-fs laser fields at 750 nm and an intensity of 1.6 x 10(14) W/cm(2). The Ar2+ ionization yield shows a pronounced CEP dependence which compares well with recent theoretical predictions employing quantitative rescattering theory [S. Micheau et al., Phys. Rev. A 79, 013417 (2009)]. Furthermore, we find strong CEP influences on the Ar2+ momentum spectra along the laser polarization axis.

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