Journal
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume 16, Issue 17, Pages 7692-7696Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/c3cp54622e
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The electronic structure of nano-NiO was determined using resonant inelastic X-ray scattering (RIXS) spectroscopy. The nanosized NiO particles were reduced in situ, leading to the formation of metallic Ni in a single step. Time-resolved RIXS elucidated in real time the changes on the occupied and unoccupied electronic structure of the material, which are dramatically affected by the reduction process.
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