Temperature-dependent study of the Raman A mode of Cu2ZnSnS4 thin films

This temperature-dependent Raman study of kesterite phase Cu2ZnSnS4 (CZTS) thin film was performed over the temperature range 98-378 K. A detailed qualitative analysis showed that the Raman data for the A mode of vibration, the strongest peak for kesterite CZTS films, fit very well to a damped harmonic oscillator (DHO) model. This investigation of temperature-dependent Raman data shows that the observed frequency shift is due to the cumulative effect of thermal expansion and anharmonicity resulting from a 4-phonon damping process. The temperature dependence of linewidth is also consistent with the above analysis. (C) 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim