Journal
ULTRAMICROSCOPY
Volume 159, Issue -, Pages 147-151Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2015.02.016
Keywords
Zirconium; Zirconia; Surface oxidation; X-Ray photoelectron spectroscopy; Field ion microscopy
Categories
Funding
- Austrian Science Fund (FWF) [SFB F45 FOXSI]
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An improved methodology of the Zr specimen preparation was developed which allows fabrication of stable Zr nanotips suitable for FIM and AP applications. Initial oxidation of the Zr surface was studied on a Zr nanotip by FIM and on a polycrystalline Zr foil by XPS, both at low oxygen pressure (10(-8)-10(-7) mbar). The XPS data reveal that in a first, fast stage of oxidation, a Zr suboxide interlayer is formed which contains three suboxide components (Zr+1, Zr+2 and Zr+3) and is located between the Zr surface and a stoichiometric ZrO2 overlayer that grows in a second, slow oxidation stage. The sole suboxide layer has been observed for the first time at very early states of the oxidation (oxygen exposure <= 4 L). The Ne+ FIM observations are in accord with a two stage process of Zr oxide formation. (C) 2015 The Authors. Published by Elsevier B.V.
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