Journal
PHILOSOPHICAL MAGAZINE LETTERS
Volume 93, Issue 11, Pages 618-624Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/09500839.2013.830792
Keywords
thin films; atomic force microscopy; crack growth; deformation
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Funding
- Austrian Science Fund (FWF) [P22648-N20]
- Austrian Science Fund (FWF) [P 22648] Funding Source: researchfish
- Austrian Science Fund (FWF) [P22648] Funding Source: Austrian Science Fund (FWF)
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Fragmentation testing of thin films on substrates has in the past been mostly performed in situ using optical and scanning electron microscopy. While these techniques work well for brittle materials, they cannot always discern the difference between through-thickness cracks (TTCs) and localized plastic deformation of ductile films. Here, we describe fragmentation testing with atomic force microscopy and present criterion to distinguish TTCs and localized deformation for ductile films.
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