Related references
Note: Only part of the references are listed.The Mn+1AXn phases: Materials science and thin-film processing
Per Eklund et al.
THIN SOLID FILMS (2010)
Recent Progress in Theoretical Prediction, Preparation, and Characterization of Layered Ternary Transition-Metal Carbides
Jingyang Wang et al.
Annual Review of Materials Research (2009)
Revisiting the defect structure of MAX phases: the case of Ti(4)AlN(3)
A. Joulain et al.
PHILOSOPHICAL MAGAZINE (2008)
A new ternary nanolaminate carbide:: Ti3SnC2
Sylvain Dubois et al.
JOURNAL OF THE AMERICAN CERAMIC SOCIETY (2007)
WSXM: A software for scanning probe microscopy and a tool for nanotechnology
I. Horcas et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2007)
Kink formation around indents in laminated Ti3SiC2 thin films studied in the nanoscale
JM Molina-Aldareguia et al.
SCRIPTA MATERIALIA (2003)
Ti3SiC2:: A damage tolerant ceramic studied with nano-indentations and transmission electron microscopy
BJ Kooi et al.
ACTA MATERIALIA (2003)
Structure of Ti4AlN3 -: a layered Mn+1AXn nitride
CJ Rawn et al.
MATERIALS RESEARCH BULLETIN (2000)
Share Paper
