Journal
PHILOSOPHICAL MAGAZINE
Volume 88, Issue 9, Pages 1307-1320Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/14786430802126615
Keywords
dislocations; microstructural analysis; transmission electron microscopy
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Microstructural study of as-grown Ti(4)AlN(3) MAX phase has been performed by transmission electron microscopy. Dislocation walls, dislocation nucleation sites and stacking faults are described. In particular, diffraction contrast analysis combined with high-resolution images give a new insight into the nature of the stacking faults: contrarily to what is usually postulated, it is shown that the stacking faults possess a shear component in the basal plane. The stacking faults are created by the insertion of MX layers in the lattice via diffusion mechanisms. Their possible role on the deformation mechanism of MAX phases is discussed.
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