Related references
Note: Only part of the references are listed.New model for low-temperature oxidation of copper single crystal
Kensuke Fujita et al.
APPLIED SURFACE SCIENCE (2013)
Time Dependent Dielectric Breakdown in Copper Low-k Interconnects: Mechanisms and Reliability Models
Terence K. S. Wong
MATERIALS (2012)
Optical and structural properties of copper oxide thin films grown by oxidation of metal layers
G. Papadimitropoulos et al.
THIN SOLID FILMS (2006)
CU2O as active species in the steam reforming of methanol by CuO/ZrO2 catalysts
H Oguchi et al.
APPLIED CATALYSIS A-GENERAL (2005)
Ultrathin films of lead oxide on gold:: Dependence of stoichiometry, stability and thickness on O2 pressure and annealing temperature
L Bouzidi et al.
SURFACE SCIENCE (2005)
Film thickness studies for the chemically synthesized conducting polyaniline
MM Ayad et al.
EUROPEAN POLYMER JOURNAL (2003)
Field-induced cation migration in Cu oxide films by in situ scanning tunneling microscopy
JP Singh et al.
APPLIED PHYSICS LETTERS (2003)
Oxidation mechanism of copper at 623-1073 K
YF Zhu et al.
MATERIALS TRANSACTIONS (2002)
Optical characterization of thin thermal oxide films on copper by ellipsometry
H Derin et al.
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING (2002)
High-performance interconnects: An integration overview
RH Havemann et al.
PROCEEDINGS OF THE IEEE (2001)
Share Paper
