Journal
ORGANIC ELECTRONICS
Volume 11, Issue 5, Pages 860-863Publisher
ELSEVIER
DOI: 10.1016/j.orgel.2010.01.029
Keywords
Organic field-effect transistors (OFETs); Pentacene; Doping; Contact resistance
Funding
- National Science Foundation [DMR-0120967]
- Office of Naval Research [N00014-04-1-0120]
- NSF [ECS-03-35765]
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The contact resistance in pentacene organic field-effect transistors (OFETs) is found to be significantly reduced by selectively doping the organic semiconductor region beneath the source/drain electrodes. A 10 nm co-evaporated (1: 1 ratio) layer of molybdenum tris-[1,2-bis(trifluoromethyl) ethane-1,2-dithiolene] and pentacene was deposited under the metal electrodes for this purpose. The width-normalized contact resistance (varying channel lengths of 25-200 mu m used for the study) in contact-doped devices was lowered significantly (0.5 k Omega-cm) in comparison to reference devices (3.4 k Omega-cm) in the accumulation regime (V-GS = similar to 30 V). Doping of the contacts did not affect the stability of the devices under continuous bias stress significantly. (C) 2010 Elsevier B. V. All rights reserved.
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