Low-voltage organic thin-film transistors with hydrophobic hafnium oxynitride film as gate insulator

An excellent gate dielectric of amorphous HfON (a-HfON) can be fabricated by flashing a Hf metal layer prior to a-HfON deposition. Nitrogen incorporation in the HfON film can reduce leakage current density from 8 x 10(-7) to 10(-7) A/cm(2). And surface roughness of a-HfON is reduced by the flash Hf metal layer from 1.9 to 1.2 nm. With the flash Hf metal layer, field effect mobility (0.17 cm(2)/V s), threshold voltage (-0.3 V), subthreshold swing (-0.209 V/decade), and on/off current ratio (3.2 x 10(3)) can be achieved for organic thin-film transistors with a-HfON gate dielectric. (C) 2009 Elsevier B.V. All rights reserved.