Journal
THIN SOLID FILMS
Volume 582, Issue -, Pages 356-360Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2014.10.078
Keywords
Chalcopyrites; CIGS; CIGSe; X-ray absorption spectroscopy; EXAFS; Nanostructure; Thin film solar cells
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Funding
- Carl-Zeiss-Stiftung
- German Federal Ministry for Economic Affairs and Energy [0325448E]
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Atomic-scale structural parameters of Cu(In, Ga)Se-2 powders and polycrystalline thin films were determined as a function of the In and Cu contents using X-ray absorption spectroscopy. No difference in the two sample types is observed for the average bond lengths demonstrating the strong tendency towards bond length conservation typical for tetrahedrally coordinated semiconductors. In contrast, the bond length variation is significantly smaller in the thin films than in the powders, particularly for Cu-poor material. This difference in the nanostructure is proposed to originate from differences in the preparation conditions, most prominently from the different history of Cu composition. (C) 2014 Elsevier B.V. All rights reserved.
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