4.6 Article

Energy flux and Goos-Hanchen shift in frustrated total internal reflection

Journal

OPTICS LETTERS
Volume 37, Issue 9, Pages 1526-1528

Publisher

OPTICAL SOC AMER
DOI: 10.1364/OL.37.001526

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Funding

  1. National Natural Science Foundation of China [60806041, 61176118]
  2. Innovative Foundation of Shanghai University
  3. Shanghai Leading Academic Discipline Program [s30105]
  4. Juan de la Cierva Programme
  5. Basque Government [IT472-10]
  6. UPV/EHU [UFI 11/55]
  7. MICINN [FIS2009-12773-C02-01]

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Using Yasumoto and Oishi's energy flux method, a generalized analytical formulation for analyzing the Goos-Hanchen (GH) shift in frustrated total internal reflection is provided, from which the GH shift given by Artman's stationary phase method is shown to equal the GH calculated by Renard's conventional energy flux method plus a self-interference shift. The self-interference shift, originating from the interference between the incident and reflected beams, sheds light on the asymptotic behavior of the GH shift in such optical tunneling process in term of energy flux. (C) 2012 Optical Society of America

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