Journal
OPTICS LETTERS
Volume 36, Issue 8, Pages 1335-1337Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.36.001335
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Funding
- Lawrence Livermore National Laboratory [B591129]
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Two quartz (10-11) crystals were cylindrically bent to a 25: 4 cm radius of curvature and were mounted in identical Cauchois-type transmission spectrometers, and the crystal diffraction efficiencies were measured to 5% absolute accuracy using narrow bandwidth x-ray source fluences in the 20 to 80 keV energy range. The measured integrated reflectivity values were compared to calculations performed using a computational model that accounts for the diffraction geometry of the bent transmission crystal. These crystal calibrations enable the accurate measurement of absolute hard x- ray emission levels from laser- produced plasmas and other laboratory sources.
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