4.6 Article

Ultrathin nickel oxide film as a hole buffer layer to enhance the optoelectronic performance of a polymer light-emitting diode

Journal

OPTICS LETTERS
Volume 36, Issue 8, Pages 1521-1523

Publisher

OPTICAL SOC AMER
DOI: 10.1364/OL.36.001521

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Funding

  1. National Natural Science Foundation of China (NSFC) [10904042, 61078046]
  2. Chinese Ministry of Education [210157]
  3. Natural Science Foundation of Guangdong Province, China [8251063101000007, 10151063101000009, 9451063101002082]
  4. Scientific & Technological Plan of Guangdong Province [2008B010200004, 2010B010600030, 2009B011100003]
  5. Fundamental Research Funds for the Central Universities [HUST 2010MS069]
  6. Program for New Century Excellent Talents in University, China [07-0319]

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In order to promote a polymer LED (PLED), we fabricated and introduced an ultrathin nickel oxide (NiO) buffer layer (< 10 nm) between the indium tin oxide (ITO) anode and the poly (3, 4-ethylenedioxythiophene) hole injection layer in the PLED. The NiO buffer layer was easily formed on the ITO anode by electron-beam deposition of a nickel (Ni) metal source and an oxygen plasma treatment process. As a result, the PLED device with the NiO buffer layer on its ITO anode had the same turn-on voltage as conventional PLED devices without the NiO buffer layer, and the luminance of the PLED device with the NiO buffer layer was doubled, compared with the conventional PLED devices without the NiO buffer layer. Improvement of the optoelectronic performance of the PLED can be attributed to the increase of the current driven into the diode, resulting from the NiO buffer layer, which can enhance the hole injection and balance the injection of the two types of carriers (holes and electrons). Thus it is an excellent choice to introduce the NiO buffer layer onto the ITO anode of the PLED devices in order to enhance the optoelectronic performance of PLED devices. (c) 2011 Optical Society of America

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