4.6 Article

Fast localized wavefront correction using area-mapped phase-shift interferometry

Journal

OPTICS LETTERS
Volume 36, Issue 15, Pages 2892-2894

Publisher

OPTICAL SOC AMER
DOI: 10.1364/OL.36.002892

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Funding

  1. National Institute of Health (NIH) National Institute of Biomedical Imaging and Bioengineering (NIBIB) [R01-EB000184]
  2. National Science Foundation (NSF) Chemical, Bioengineering, Environmental, and Transport Systems (CBET) [0959525]
  3. Wisconsin Institutes for Discovery
  4. Leifur Eiriksson Foundation
  5. Div Of Chem, Bioeng, Env, & Transp Sys
  6. Directorate For Engineering [0959525] Funding Source: National Science Foundation

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We propose an innovative method for localized wavefront correction based on area-mapped phase-shift (AMPS) interferometry. In this Letter, we present the theory and then experimentally compare it with a previously demonstrated method based on spot-optimized phase-stepping (SOPS) interferometry. We found that AMPS outperforms SOPS interferometry in terms of speed by threefold, although in noisy environments the improvements may be larger. AMPS yielded similar point-spread functions (PSF) as SOPS for moderate system-induced aberrations, but yielded a slightly less ideal PSF for larger aberrations. The method described in this Letter may prove crucial for applications where the phase-stepping solution does not have sufficient speed. (C) 2011 Optical Society of America

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