Journal
OPTICS LETTERS
Volume 35, Issue 17, Pages 2849-2851Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.35.002849
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Funding
- Engineering and Physical Sciences Research Council (EPSRC), UK
- Engineering and Physical Sciences Research Council [EP/C013956/1] Funding Source: researchfish
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The propagation loss of a direct UV-written silica-on-silicon waveguide is measured using an elegant nondestructive method. The technique uses integrated Bragg grating structures, which are observed from opposing launch directions to obtain information about the optical power at different positions along the length of the waveguide. Critically, the technique is ratiometric and independent of coupling loss and grating variability. This high-precision measurement is suitable for low-loss planar waveguides. From this data, the propagation loss of the UV-written waveguides was observed to be 0.235 +/- 0.006 dB/cm. (C) 2010 Optical Society of America
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