Journal
OPTICS LETTERS
Volume 36, Issue 1, Pages 4-6Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.36.000004
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- U.S. Air Force Office of Scientific Research (USAFOSR) [FA9550-06-1-047]
- National Science Foundation (NSF) [ECCS-0846651]
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Stimulated emission from sensitized erbium ions in silicon-rich silicon nitride is demonstrated by pump-probe measurements carried out in waveguides. A decrease in the photoinduced absorption of the probe at the wavelength of erbium emission is observed and is attributed to stimulated emission from erbium excited indirectly via localized states in the silicon nitride matrix. (C) 2010 Optical Society of America
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