Journal
OPTICS LETTERS
Volume 34, Issue 7, Pages 1078-1080Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.34.001078
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- Italian Ministry of Foreign Affairs (Direzione Generale per la Promozione e la Cooperazione Culturale)
- Istituto Superiore delle Comunicazioni e delle Tecnologie dell'Informazione (ISCOM), Rome, Italy
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A novel technique, based on polarization-sensitive, frequency-domain reflectometry, for a full noninvasive characterization of spin profile in randomly birefringent spun fibers is presented. Effective measurements of spin profile in a fiber sample a few tens of meters long are reported, but the technique can be straightforwardly scaled to kilometers-long samples. (C) 2009 Optical Society of America
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