Journal
OPTICS EXPRESS
Volume 21, Issue 25, Pages 31263-31273Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.21.031263
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Funding
- 973 Program [2013CB328802]
- NSFC [61225022, 61036008]
- 863 Program [2012AA011901, 2012AA03A301]
- Samsung Electronics Inc.under the Samsung Advanced Institute of Technology (SAIT) Global Research Outreach (GRO) Program
- [DPI2012-32994]
- [PROMETEO2009-077]
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In this paper, we analyze the depth of field (DOF) of integral imaging displays based on wave optics. With considering the diffraction effect, we analyze the intensity distribution of light with multiple microlenses and derive a DOF calculation formula for integral imaging display system. We study the variations of DOF values with different system parameters. Experimental results are provided to verify the accuracy of the theoretical analysis. The analyses and experimental results presented in this paper could be beneficial for better understanding and designing of integral imaging displays. (C) 2013 Optical Society of America
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