Journal
OPTICS EXPRESS
Volume 19, Issue 10, Pages 9336-9344Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.19.009336
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Funding
- NSERC
- Canadian Institute for Photonics Innovations
- MURI [W911NF-07-1-0475]
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Building on the work of Alnaser et al. [Phys. Rev. A 70, 023413 (2004)], we devise an improved method for an in-situ measurement of the peak intensity in a focused, femtosecond infrared laser pulse. The method is shown to be effective with both photoion and photoelectron imaging devices. The model used to fit the experimental data has no unphysical free parameters used in fitting. The accuracy of the fit is 4% and the overall accuracy of the measurement is 8%. (C) 2011 Optical Society of America
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