Journal
OPTICS EXPRESS
Volume 19, Issue 11, Pages 10647-10655Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.19.010647
Keywords
-
Categories
Ask authors/readers for more resources
Terahertz time domain spectroscopy allows for characterization of dielectrics even in cases where the samples thickness is unknown. However, a parameter extraction over a broad frequency range with simultaneous thickness determination is time consuming using conventional algorithms due to the large number of optimization steps. In this paper we present a novel method to extract the data. By employing a three dimensional optimization algorithm the calculation effort is significantly reduced while preserving the same accuracy level as conventional approaches. The presented method is even fast enough to be used in imaging applications. (C) 2011 Optical Society of America
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available