Journal
OPTICS EXPRESS
Volume 18, Issue 15, Pages 15597-15602Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.18.015597
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Funding
- National Natural Science Foundation of China [60508015, 10574092]
- National Basic Research Program 973 of China [2006CB806000]
- Shanghai Leading Academic Discipline Project [B201]
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In this paper, a method of domain wall characterization in ferroelectrics through Cherenkov second harmonic generation by localized nonlinearities is proposed. By this method, domain wall width is estimated to be less than 10nm. High spatial angular resolution of about 10mrad in the experiment reveals the fine structures of the domain walls. Combined with scanning techniques, this method can reconstruct domain wall patterns with high resolution. This method has advantages of being nondestructive, noncontact, in situ as well as of high resolution. (C) 2010 Optical Society of America
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