Journal
OPTICS EXPRESS
Volume 18, Issue 19, Pages 20491-20497Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.18.020491
Keywords
-
Categories
Funding
- National Keystone Basic Research Program (973 Program) [2007CB310408, 2006CB302901]
- National Natural Science Foundation of China [10804077]
- State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences
Ask authors/readers for more resources
We present a polarization-controlled terahertz(THz) spectroscopy method to characterize the birefringent materials. The polarization of THz wave was controlled by changing the relative phase of the fundamental and second-harmonic waves in the two-color laser-induced air plasma THz generation configuration. The optical axis orientation was investigated through detecting one component of the transmitted THz electric field by continuously changing the electric field direction of the linearly polarized incident THz wave. This work demonstrates that the polarization-controlled THz spectroscopy can be used to study the anisotropy of the inner structure for birefringent materials. (C) 2010 Optical Society of America
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available