Journal
OPTICS EXPRESS
Volume 18, Issue 26, Pages 27836-27845Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.18.027836
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Funding
- Czech Ministry of Education [LC510, LC528, ME10046, LA08024]
- Czech Science Foundation [GD202/08/H057, P208/10/2302]
- Academy of Sciences of the Czech Republic [AV0Z10100523, IAAX00100903, KAN300100702]
- European Community [RII3-CT-2004-506008]
- FLASH team at DESY
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We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (A(eff)) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds. (C) 2010 Optical Society of America
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