Journal
OPTICS EXPRESS
Volume 18, Issue 9, Pages 9429-9434Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.18.009429
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Funding
- National Research Foundation
- Ministry of Education, Science and Technology of Korea [2009-0074213]
- National Research Council of Science & Technology (NST), Republic of Korea [K10002] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
- National Research Foundation of Korea [2009-0074213] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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We developed an accurate and efficient method for measuring the refractive indices of a transparent plate by analyzing the transmitted intensity versus angle of incidence. By using two different wavelengths, we resolved the 2 pi-ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty of 10(-5). The validity and the accuracy of our method were confirmed with a standard reference material. Furthermore, our method is insensitive to environmental perturbations, and simple to implement, compared to the conventional index measurement methods providing similar accuracy. (C) 2010 Optical Society of America
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