Journal
OPTICS EXPRESS
Volume 18, Issue 18, Pages 18598-18614Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.18.018598
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Funding
- Division of Materials Sciences and Engineering, Office of Basic Energy Sciences, at the Department of Energy [DE-FG02-07ER46128]
- National Institute for General Medical Services at the National Institutes for Health [5R21EB6134]
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The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. We show here that the first step in data analysis, the assembly of two-dimensional diffraction patterns from a large set of raw diffraction data, is crucial to obtaining reconstructions of highest possible consistency. We have developed software that automates this process and results in consistently accurate diffraction patterns. We have furthermore derived some criteria of validity for a tool commonly used to assess the consistency of reconstructions, the phase retrieval transfer function, and suggest a modified version that has improved utility for judging reconstruction quality. (C) 2010 Optical Society of America
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