4.6 Article

Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

Journal

OPTICS EXPRESS
Volume 17, Issue 20, Pages 18271-18278

Publisher

OPTICAL SOC AMER
DOI: 10.1364/OE.17.018271

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Funding

  1. EPSRC [EP/D06337X/1, EP/F020449/1] Funding Source: UKRI
  2. Engineering and Physical Sciences Research Council [EP/F020449/1, EP/D06337X/1] Funding Source: researchfish

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We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of <= 1 mu m. Observations were correlated with simulations of best focus to provide further relevant information. (C) 2009 Optical Society of America

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