4.6 Article

Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy

Journal

OPTICS EXPRESS
Volume 17, Issue 16, Pages 13541-13553

Publisher

OPTICAL SOC AMER
DOI: 10.1364/OE.17.013541

Keywords

-

Categories

Funding

  1. Division of Materials Sciences and Engineering, Office of Basic Energy Sciences
  2. Department of Energ [DE-FG02-07ER46128]
  3. National Institute for General Medical Services at the National Institutes for Health [5R21EB6134]

Ask authors/readers for more resources

Using a signal-to-noise ratio estimation based on correlations between multiple simulated images, we compare the dose efficiency of two soft x-ray imaging systems: incoherent brightfield imaging using zone plate optics in a transmission x-ray microscope (TXM), and x-ray diffraction microscopy (XDM) where an image is reconstructed from the far-field coherent diffraction pattern. In XDM one must computationally phase weak diffraction signals; in TXM one suffers signal losses due to the finite numerical aperture and efficiency of the optics. In simulations with objects representing isolated cells such as yeast, we find that XDM has the potential for delivering equivalent resolution images using fewer photons. This can be an important advantage for studying radiation-sensitive biological and soft matter specimens. (C) 2009 Optical Society of America

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available