Journal
OPTICS EXPRESS
Volume 16, Issue 8, Pages 5453-5464Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.16.005453
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We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a similar to 10(2) near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations. (C) 2008 Optical Society of America.
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