4.6 Article

High reflectivity gratings on silicon-on-insulator waveguide facets

Journal

OPTICS EXPRESS
Volume 16, Issue 21, Pages 16481-16488

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OPTICAL SOC AMER
DOI: 10.1364/OE.16.016481

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We demonstrate by numerical simulations and experiments that highly reflective (HR) facets can be formed on silicon waveguides with high reflectivity diffraction gratings. We use an HR grating with a plane wave reflectivity exceeding 99.99%, as calculated by rigorous coupled wave analysis. Experimentally, we demonstrate the HR effect for silicon-on-insulator waveguide facets patterned lithographically with grating structures. Due to a strong mode size dependence, the maximum facet reflectivity for 1.5 mu m thick waveguide is 77%, but finite difference time-domain simulations show that modal reflectivies larger than 90% can be achieved for silicon waveguides with thicknesses of 4 mu m or more. (c) 2008 Optical Society of America

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