4.6 Article

Holistic characterization of complex transmittances generated by infrared sub-wavelength gratings

Journal

OPTICS EXPRESS
Volume 16, Issue 10, Pages 7060-7070

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OPTICAL SOC AMER
DOI: 10.1364/OE.16.007060

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We present a characterization technique of wide-area sub-wavelength structures. The optical bench is based on lateral shearing interferometry, which allows an accurate complex transmittance (phase and amplitude) measurement. The experimental validation is made in the long-wavelength infrared domain; more precisely we work in the integrated 8-9 mu m spectral range. Measurements of the transmitted amplitude and phase shift reveal a good agreement with respectively experimental results based on Fourier Transform infrared spectrometry, and theoretical simulations. (C) 2008 Optical Society of America.

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