Journal
OPTICS EXPRESS
Volume 16, Issue 23, Pages 18881-18888Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.16.018881
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- NSF [NIRT-ECS0403865/ECE0424210]
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We report near- to far-field measurement of optical wavefronts emanating from a nanoslit formed in a thin (50 nm thick) Ag film. The evolution of optical phases is imaged using a self-interference technique in conjunction with a scanning probe method. The phase relationship of the slit-transmitted waves with respect to the direct transmission through the thin metal film is quantitatively established. The singular-phase points resulting from the interplay of slit diffraction and surface plasmons are identified in the intermediate-field region. (C) 2008 Optical Society of America
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