Journal
OPTICS EXPRESS
Volume 16, Issue 12, Pages 8748-8754Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.16.008748
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Disordered GaN nanopillars of three different heights: 300, 550, and 720 nm are fabricated, and demonstrate broad angular and spectral anti-reflective characteristics, up to an incident angle of 60 degrees and for the wavelength range lambda=300-1800nm. An algorithm based on a rigorous coupled-wave analysis (RCWA) method is developed to investigate the correlations between the reflective characteristics and the structural properties of the nanopillars. The broadband and omnidirectional antireflection arises mainly from the refractive-index gradient provided by nanopillars. Calculations show excellent agreement with the measured reflectivities for both s- and p-polarizations. (c) 2008 Optical Society of America.
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