4.5 Article

Effect of substrate temperature on the structural and optical properties of ZnO and Al-doped ZnO thin films prepared by dc magnetron sputtering

Journal

OPTICS COMMUNICATIONS
Volume 282, Issue 2, Pages 247-252

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.optcom.2008.10.003

Keywords

Al-doped ZnO; dc Magnetron sputtering; Microstructure; Optical properties

Categories

Funding

  1. National Natural Science Foundation of China [60708014]
  2. Distinguished Youth Foundation of Hunan Province [03JJY1008]
  3. Science Foundation for Post-doctorate of China [2004035083]
  4. Natural Science Foundation of Hunan Province [06JJ20034]
  5. Innovation project for postgraduates education of Central South University [062510029]

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ZnO and Al-doped ZnO(ZAO) thin films have been prepared on glass substrates by direct current (dc) magnetron sputtering from 99.99% pure Zn metallic and ZnO:3 wt%Al2O3 ceramic targets, the effects of substrate temperature on the crystallization behavior and optical properties of the films have been studied. It shows that the Surface morphologies of ZAO films exhibit difference from that of ZnO films, while their preferential crystalline growth orientation revealed by X-ray diffraction remains always the (002). The optical transmittance and photoluminescence (PL) spectra of both ZnO and ZAO films are obviously influenced by the substrate temperature. All films exhibit a transmittance higher than 86% in the visible region, while the optical transmittance of ZAO films is slightly smaller than that of ZnO films. More significantly, Al-doping leads to a larger optical band gap (E-g) of the films. It is found from the PL measurement that near-band-edge (NBE) emission and deep-level (DL) emission are observed in pure ZnO thin films. However, when Al was doped into thin films, the DL emission of the thin films is depressed. As the substrate temperature increases, the peak of NEE emission has a blueshift to region of higher photon energy, which shows a trend similar to the E-g in optical transmittance measurement. (C) 2008 Elsevier B.V. All rights reserved.

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