4.6 Article

Third-order nonlinear optical properties of Mn doped ZnO thin films under cw laser illumination

Journal

OPTICAL MATERIALS
Volume 35, Issue 3, Pages 431-439

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.optmat.2012.09.028

Keywords

Mn:ZnO thin Films; RF sputtering; z-scan; cw laser; NLO; Optical limiting

Funding

  1. Vision Group on Science and Technology, Department of Science and Technology, Govt. of Karnataka
  2. DST [SR/FTP/PS-33/2005]
  3. NITK/MHRD

Ask authors/readers for more resources

We report the measurements of third-order nonlinear optical properties of undoped zinc oxide and manganese doped zinc oxide thin films with different doping concentrations investigated using z-scan technique. Thin films were prepared by radio frequency magnetron sputtering using a compound target on glass substrate at room temperature. The structural properties of the deposited films were analysed by X-ray diffraction studies. The atomic force microscope analysis of the deposited films reveals that the grain size and roughness of the films depend on the Mn concentration. The direct energy band gap of the deposited film increases with the increase in Mn concentration in the films. The nonlinear optical measurements were carried out using a cw He-Ne laser at 633 nm wavelength. The z-scan results reveal that the films exhibit self-defocusing nonlinearity. The third-order nonlinear optical susceptibility chi((3)) is found to be of the order of 10(-3) esu. The films investigated here exhibit good optical power limiting at the experimental wavelength. (c) 2012 Elsevier B.V. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available