Journal
OPTICAL MATERIALS
Volume 34, Issue 12, Pages 2101-2107Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.optmat.2012.05.027
Keywords
Cerium oxide; Rare earth oxides; Refractive index; Optical properties; Thin films
Categories
Ask authors/readers for more resources
Cerium oxide films, of 0.3-1 mu m thickness, were reactively deposited in the oxygen atmosphere onto quartz plates by the PVD method. An electron gun was used as an evaporation source. Films were characterized with the AFM method, Raman spectroscopy and spectrophotometrically. Optical properties of these films were examined for the wavelength range 0.2-2.5 mu m. Films were characterized by high transparency, between 0.38 and 2.5 mu m. The complex refractive index, n=n - jk, was evaluated. The dispersion characteristics for n(lambda) and k(lambda) were presented. We found that the refractive index strongly depends on the temperature of substrates (300 K <= T-s <= 673 K) during film deposition. Estimated values of the refractive index (at lambda = 0.55 mu m) were in the range 1.91-2.34. (C) 2012 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available