Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Volume 631, Issue 1, Pages 130-133Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2010.12.040
Keywords
X-ray laser; X-ray ablation; Beam focusing; Beam characterization; Beam profile measurement
Categories
Funding
- Czech Ministry of Education [LC510, LC528, ME10046, LA08024]
- Czech Science Foundation [GAP208/10/2302]
- Academy of Sciences of the Czech Republic [AV0Z10100523, IAAX00100903, KAN300100702]
- Stanford University
- Lawrence Berkeley National Laboratory (LBNL)
- University of Hamburg through BMBF [FSP 301]
- Center for Free Electron Laser Science (CFEL)
- US Department of Energy's Office of Basic Energy Sciences
- U.S. Department of Energy by Lawrence Livermore National Laboratory [DE-AC52-07NA27344]
Ask authors/readers for more resources
X-ray lasers represent a powerful tool to explore matter under extreme conditions. A rigorous characterization of their output parameters is, therefore, of substantial importance for the purposes of the experiments being conducted at these sources. A profound knowledge of the spatial, temporal, spectral, statistical, coherence, and wavefront beam properties may protect us from an unwanted misinterpretation of the experimental data. We present an experimental technique of the spatial (transverse and longitudinal) characterization of the beam profile. Investigating ablative imprints in various materials, we evaluate the spatial properties of the incident beam, namely, the beam waist radius and position, the Rayleigh range, M(2) parameter, and divergence. In this paper, we recall briefly our recent work at the transverse beam profile reconstruction. A newly developed method of the longitudinal beam profile characterization is the main subject of this work. (C) 2010 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available