Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Volume 638, Issue 1, Pages 187-191Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2011.02.073
Keywords
X-ray computed tomography; X-ray fluorescence analysis; Energy dispersion; Iodine atoms; Tungsten-target tube; CdTe detector
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Funding
- MECSST
- Health and Labor Sciences Research Grants
- Keiryo Research Foundation
- Promotion and Mutual Aid Corporation for Private Schools of Japan
- Japan Science and Technology Agency (JST)
- New Energy and Industrial Technology Development Organization (NEDO)
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X-ray fluorescence (XRF) analysis is useful for mapping various atoms in objects, and XRF is emitted by absorbing X-ray photons with energies beyond the K-edge energy of the target atom. Narrow-energy-width bremsstrahlung X-rays are selected using a 3.0-mm-thick aluminum filter. These rays are absorbed by iodine media in objects, and iodine XRF is produced from the iodine atoms. Next, iodine K alpha photons are discriminated by a multichannel analyzer and the number of photons is counted by a counter card. CT is performed by repeated linear scans and rotations of an object. The X-ray generator has a 100 mu m focus tube with a 0.5-mm-thick beryllium window, and the tube voltage and the current for XRF were 80 kV and 0.50 mA, respectively. The demonstration of XRF-CT for mapping iodine atoms was carried out by selection of photons in an energy range from 27.5 to 29.5 keV with a photon-energy resolution of 1.2 keV. (C) 2011 Elsevier B.V. All rights reserved.
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