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NEW JOURNAL OF PHYSICS
Volume 12, Issue -, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1367-2630/12/4/043028
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We present a structural analysis of the graphene/Ru(0001) system obtained by surface x-ray diffraction. The data were fitted using Fourier-series-expanded displacement fields from an ideal bulk structure plus the application of symmetry constraints. The shape of the observed superstructure rods proves a reconstruction of the substrate, induced by strong bonding of graphene to ruthenium. Both the graphene layer and the underlying substrate are corrugated, with peak-to-peak heights of (0.82 +/- 0.15)angstrom and (0.19 +/- 0.02)angstrom for graphene and the topmost Ru-atomic layer, respectively. The Ru corrugation decays slowly over several monolayers into the bulk. The system also exhibits chirality, whereby in-plane rotations of up to 2.0 degrees in those regions of the superstructure where the graphene is weakly bound are driven by elastic energy minimization.
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