Journal
NEW JOURNAL OF PHYSICS
Volume 10, Issue -, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1367-2630/10/1/013019
Keywords
-
Categories
Ask authors/readers for more resources
We present a quantitative investigation of the impact of tip radius as well as sample type and thickness on the lateral resolution in piezoresponse force microscopy (PFM) investigating bulk single crystals. The observed linear dependence of the apparent width of a ferroelectric domain wall on the tip radius as well as the independence of the lateral resolution on the specific crystal-type are validated by a simple model. Using a Ti-Pt coated tip with a nominal radius of 15 nm the so far highest lateral resolution in bulk crystals of only 17 nm was obtained.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available